By Li Y.   Jelle Veenstra K.   Dubois J.   Peters-Wu L.   van Zomeren A.   Kuper F.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1449-1454

Elsevier‎(2003)‎

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By Merticaru A.R.   Mouthaan A.J.   Kuper F.G.   in Thin Solid Films

ISSN:0040-6090|427|1|60-66

Elsevier‎(2003)‎

Access to resources Favorite 1.8592185

By Sowariraj M.S.B.   Smedes T.   Salm C.   Mouthaan T.   Kuper F.G.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1569-1575

Elsevier‎(2003)‎

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