By Labat N.   Touboul A.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1351-1352

Elsevier‎(2003)‎

Access to resources Favorite 11.779716

By Cerepi A.   Barde J.-P.   Labat N.   in Marine and Petroleum Geology

ISSN:0264-8172|20|10|1161-1183

Elsevier‎(2003)‎

Access to resources Favorite 8.635168

By Belhaj M.   Maneux C.   Labat N.   Touboul A.   Bove P.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1731-1736

Elsevier‎(2003)‎

Access to resources Favorite 7.062896

By Curutchet A.   Malbert N.   Labat N.   Touboul A.   Gaquiere C.   Minko A.   Uren M.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1713-1718

Elsevier‎(2003)‎

Access to resources Favorite 5.889858

By Martin J.C.   Maneux C.   Labat N.   Touboul A.   Riet M.   Blayac S.   Kahn M.   Godin J.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1725-1730

Elsevier‎(2003)‎

Access to resources Favorite 5.490622