By Stellari F.   Song P.   McManus M.K.   Weger A.J.   Gauthier R.   Chatty K.V.   Muhammad M.   Sanda P.   Wu P.   Wilson S.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1603-1608

Elsevier‎(2003)‎

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