By Seifert F.   Weber R.   Mertin W.   Kubalek E.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1633-1638

Elsevier‎(2003)‎

Access to resources Favorite 7.9028206

By Heisig S.   Danzebrink H.-U.   Leyk A.   Mertin W.   Munster S.   Oesterschulze E.   in Ultramicroscopy

ISSN:0304-3991|71|1|99-105

Elsevier‎(1998)‎

Access to resources Favorite 6.5923905