By Nirschl T.   Ostermayr M.   Olbrich A.   Vietzke D.   Omer M.   Linnenbank C.   Schaper U.   Pottgiesser Y.   Pottgiesser J.   Johansson M.   Simon U.   Joens A.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1383-1387

Elsevier‎(2003)‎

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