By Beauchene T.   Tremouilles D.   Lewis D.   Perdu P.   Fouillat P.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1577-1582

Elsevier‎(2003)‎

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By Sanchez K.   Desplats R.   Perez G.   Pichetto V.   Beaudoin F.   Perdu P.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1755-1760

Elsevier‎(2003)‎

Access to resources Favorite 6.185399

By Beaudoin F.   Desplats R.   Perdu P.   Firiti A.   Haller G.   Pouget V.   Lewis D.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1681-1686

Elsevier‎(2003)‎

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By Remmach M.   Desplats R.   Beaudoin F.   Frances E.   Perdu P.   Lewis D.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1639-1644

Elsevier‎(2003)‎

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By Beaudoin F.   Carisetti D.   Clement J. C.   Desplats R.   Perdu P.   in EPJ Applied Physics (The)

ISSN:1286-0042|27|1-3|475-477

Edp Sciences‎(2010)‎

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By Crepel O.   Desplats R.   Bouttement Y.   Perdu P.   Goupil C.   Descamps P.   Beaudoin F.   Marina L.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1809-1814

Elsevier‎(2003)‎

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By Firiti A.   Faujour D.   Haller G.   Moragues J.M.   Goubier V.   Perdu P.   Beaudoin F.   Lewis D.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1563-1568

Elsevier‎(2003)‎

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By Desplats R.   Eral A.   Beaudoin F.   Perdu P.   Weger A.   McManus M.   Song P.   Stellari F.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1663-1668

Elsevier‎(2003)‎

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