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By Kuchenbecker J.   Borgarino M.   Zeuner M.   Konig U.   Plana R.   Fantini F.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1719-1723

Elsevier‎(2003)‎

Access to resources Favorite 5.7944217

 

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