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By Nirschl T. Ostermayr M. Olbrich A. Vietzke D. Omer M. Linnenbank C. Schaper U. Pottgiesser Y. Pottgiesser J. Johansson M. Simon U. Joens A. in Microelectronics Reliability
ISSN:0026-2714|43|9|1383-1387
Elsevier(2003)
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