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By Schmitt P. Pressecq F. Lafontan X. Duong Q.H. Pons P. Nicot J.M. Oudea C. Esteve D. Fourniols J.Y. Camon H. in Microelectronics Reliability
ISSN:0026-2714|43|9|1957-1962
Elsevier(2003)
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