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By O'Keefe M.A.   Hetherington C.J.D.   Wang Y.C.   Nelson E.C.   Turner J.H.   Kisielowski C.   Malm J.-O.   Mueller R.   Ringnalda J.   Pan M.   Thust A.   in Ultramicroscopy

ISSN:0304-3991|89|4|215-241

Elsevier‎(2001)‎

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