By Kanert W.   Dettmer H.   Plikat B.   Seliger N.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1839-1846

Elsevier‎(2003)‎

Access to resources Favorite 7.2593117

By Coquery G.   Lefranc G.   Licht T.   Lallemand R.   Seliger N.   Berg H.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1871-1876

Elsevier‎(2003)‎

Access to resources Favorite 6.054431

By Castellazzi A.   Kartal V.   Kraus R.   Seliger N.   Honsberg-Riedl M.   Schmitt-Landsiedel D.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1877-1882

Elsevier‎(2003)‎

Access to resources Favorite 5.6427946