By Sewell P.   in Theoretical Computer Science

ISSN:0304-3975|274|1|183-230

Elsevier‎(2002)‎

Access to resources Favorite 12.677424

By Sewell P. M   in Innovations In Education & Training International

ISSN:1469-8420|37|4|304-313

Routledge Ltd‎(2000)‎

Access to resources Favorite 11.298282

By Scott I.   Vukovic A.   Sewell P.   in COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng.

ISSN:0332-1649|28|5|1290-1297

Emerald Group Publishing Ltd‎(2009)‎

Access to resources Favorite 7.750997

By Hussein R.   Sewell P. F. T.   in Journal of Obstetrics & Gynaecology

ISSN:1364-6893|20|3|313-314

Informa Healthcare‎(2000)‎

Access to resources Favorite 7.750997

By Sakhnenko N.   Benson T.   Sewell P.   Nerukh A.   in Optical and Quantum Electronics

ISSN:0306-8919|38|1-3|71-81

Springer Publishing Company ‎(2006)‎

Access to resources Favorite 7.028283

By Biwojno K.   Sewell P.   Liu Y.   Christopoulos C.   in Optical and Quantum Electronics

ISSN:0306-8919|38|1-3|187-201

Springer Publishing Company ‎(2006)‎

Access to resources Favorite 6.338712

By Lousteau J.   Furniss D.   Seddon A.B.   Sewell P.   Benson T.M.   in Materials Science and Engineering: B

ISSN:0921-5107|105|1|73-77

Elsevier‎(2003)‎

Access to resources Favorite 5.649141

By Ramazani M.R.   Noroozi S.   Sewell P.   Khandan R.   Cripps B.   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|55|8|442-448

The British Institute of Non-Destructive Testing‎(2013)‎

Access to resources Favorite 5.649141

By Zhang Y.   Benson T.   Sewell P.   Vukovic A.   Zhang D.   Pan W.   Loni A   Furniss D.   Seddon A.   in Optical and Quantum Electronics

ISSN:0306-8919|38|1-3|97-110

Springer Publishing Company ‎(2006)‎

Access to resources Favorite 4.581641

By Amali R   Noroozi S   Vinney J   Sewell P   Andrews S   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|50|7|374-383

The British Institute of Non-Destructive Testing‎(2008)‎

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