By Shohji I.   Mori H.   Orii Y.   in Microelectronics Reliability

ISSN:0026-2714|44|2|269-274

Elsevier‎(2004)‎

Access to resources Favorite 10.060675

By Shohji I.   Yoshida T.   Takahashi T.   Hioki S.   in Materials Science and Engineering: A

ISSN:0921-5093|366|1|50-55

Elsevier‎(2004)‎

Access to resources Favorite 8.228484