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By Horsfall A.B.   dos Santos J.M.M.   Soare S.M.   Wright N.G.   O'Neill A.G.   Bull S.J.   Walton A.J.   Gundlach A.M.   Stevenson J.T.M.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1797-1801

Elsevier‎(2003)‎

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