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By Andreini A.   Neva C.   Renard L.   Sironi G.   Speroni F.   Sponton L.   Tampellini F.   Tiziani R.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1377-1382

Elsevier‎(2003)‎

Access to resources Favorite 6.038104

 

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