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By Horsfall A.B. dos Santos J.M.M. Soare S.M. Wright N.G. O'Neill A.G. Bull S.J. Walton A.J. Gundlach A.M. Stevenson J.T.M. in Microelectronics Reliability
ISSN:0026-2714|43|9|1797-1801
Elsevier(2003)
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