By Tiemeijer P.C.   in Ultramicroscopy

ISSN:0304-3991|78|1|53-62

Elsevier‎(1999)‎

Access to resources Favorite 21.205065

By Su D.S.   Zandbergen H.W.   Tiemeijer P.C.   Kothleitner G.   Havecker M.   Hebert C.   Knop-Gericke A.   Freitag B.H.   Hofer F.   Schlogl R.   in Micron

ISSN:0968-4328|34|3|235-238

Elsevier‎(2003)‎

Access to resources Favorite 7.492403