By Mendizabal L.   Verneuil J.L.   Bechou L.   Aupetit-Berthelemot C.   Deshayes Y.   Verdier F.   Dumas J.M.   Danto Y.   Laffitte D.   Goudard J.L.   Hernandez Y.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1743-1749

Elsevier‎(2003)‎

Access to resources Favorite 6.782852