By Von Rottkay K.   Rubin M.   Wen S.-J.   in Thin Solid Films

ISSN:0040-6090|306|1|10-16

Elsevier‎(1997)‎

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By Ren Y.   He A.-L.   Shi S.-T.   Guo G.   Chen L.   Wen S.-J.   Wong R.   Vonno N.   Bhuva B.   in Journal of Electronic Testing

ISSN:0923-8174|30|1|149-154

Springer Publishing Company ‎(2014)‎

Access to resources Favorite 5.347492