By Dubec V.   Bychikhin S.   Blaho M.   Pogany D.   Gornik E.   Willemen J.   Qu N.   Wilkening W.   Zullino L.   Andreini A.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1557-1561

Elsevier‎(2003)‎

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