By Horsfall A.B.   dos Santos J.M.M.   Soare S.M.   Wright N.G.   O'Neill A.G.   Bull S.J.   Walton A.J.   Gundlach A.M.   Stevenson J.T.M.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1797-1801

Elsevier‎(2003)‎

Access to resources Favorite 5.1097503

By Tiwari Amit K.   Goss J. P.   Briddon P. R.   Horsfall A. B.   Wright N. G.   Jones R.   Rayson M. J.   in EPL (EUROPHYSICS LETTERS)

ISSN:0295-5075|108|4|46005-46005

Edp Sciences‎(2014)‎

Access to resources Favorite 2.4137664