By Postek Michael T   Vladár András   Dagata John   Farkas Natalia   Ming Bin   Wagner Ryan   Raman Arvind   Moon Robert J   Sabo Ronald   Wegner Theodore H   Beecher James   in Measurement Science and Technology

ISSN:0957-0233|22|2|24005-24014

IOP Publishing‎(2011)‎

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