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ISSN:0022-4715|117|3-4|427-452

Springer Publishing Company ‎(2004)‎

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By Ishay Jacob S.   Plotkin Marian   Ermakov Natalya Y.   Volynchik Stanislav   Barkay Zahava   Bergman David J.   in Journal of Electron Microscopy

ISSN:0022-0744|55|1|41-49

Oxford University Press‎(2006)‎

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