By Füser H   Eichstädt S   Baaske K   Elster C   Kuhlmann K   Judaschke R   Pierz K   Bieler M   in Measurement Science and Technology

ISSN:0957-0233|23|2|25201-25210

IOP Publishing‎(2012)‎

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By Bieler M.   Spitzer M.   Hein G.   Siegner U.   Göbel E.O.   in Applied Physics A

ISSN:0947-8396|78|4|429-433

Springer Publishing Company ‎(2004)‎

Access to resources Favorite 1.471413