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Springer Publishing Company ‎(2004)‎

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By Füser H   Eichstädt S   Baaske K   Elster C   Kuhlmann K   Judaschke R   Pierz K   Bieler M   in Measurement Science and Technology

ISSN:0957-0233|23|2|25201-25210

IOP Publishing‎(2012)‎

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