By Goudard J.L.   Boddaert X.   Perinet J.   Laffitte D.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1767-1769

Elsevier‎(2003)‎

Access to resources Favorite 8.391643

By Bensaid B.   Boddaert X.   Benaben P.   Gwoziecki R.   Coppard R.   in EPJ Applied Physics (The)

ISSN:1286-0042|55|2|23907-23907

Edp Sciences‎(2011)‎

Access to resources Favorite 8.391643