By Breitenstein Otwin   in International Journal of Nanoparticles

ISSN:1753-2507|6|2-3|81-92

Inderscience Publishers‎(2013)‎

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Beam Injection Assessment of Defects in Semiconductors‎

By Kittler Martin; Breitenstein Otwin; Endrös A.  

ISBN:9783035706826

Trans Tech Publications‎(1998)‎

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