By Naquin Clint A.   Hasan Omar A.   Liou Wei-Ting   Lee Roxanne R.   Halbert Armand J.   Phung Anthony T.   Liu An-Ting   Bursa Emin J.   Shen Yulong   Taylor David W.   Slinker Jason D.   in Measurement Science and Technology

ISSN:0957-0233|24|5|55101-55104

IOP Publishing‎(2013)‎

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