By Capano M.   Ryu S.   Melloch M.   Cooper J.   Buss M.   in Journal of Electronic Materials

ISSN:1543-186X|27|4|370-376

Springer Publishing Company ‎(1998)‎

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By Moloni K.   Buss M.R.   Andres R.P.   in Ultramicroscopy

ISSN:0304-3991|80|4|237-246

Elsevier‎(1999)‎

Access to resources Favorite 1.7122041