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By Coquery G.   Lefranc G.   Licht T.   Lallemand R.   Seliger N.   Berg H.   in Microelectronics Reliability

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Elsevier‎(2003)‎

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By Frappé E.   De Bernardinis A.   Bethoux O.   Candusso D.   Harel F.   Marchand C.   Coquery G.   in EPJ Applied Physics (The)

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Edp Sciences‎(2011)‎

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