By Wiesauer K   Pircher M   Gtzinger E   Hitzenberger C K   Engelke R   Grtzner G   Ahrens G   Oster R   Stifter D   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|49|5|275-278

The British Institute of Non-Destructive Testing‎(2007)‎

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By Kouba J.   Engelke R.   Bednarzik M.   Ahrens G.   Scheunemann Heinz-Ulrich   Gruetzner G.   Loechel B.   Miller H.   Haase D.   in Microsystem Technologies

ISSN:0946-7076|13|3-4|311-317

Springer Publishing Company ‎(2007)‎

Access to resources Favorite 1.2995179