By Simoen E.   Claeys C.   Sioncke S.   Steenbergen J.   Meuris M.   Forment S.   Vanhellemont J.   Clauws P.   Theuwis A.   in Journal of Materials Science: Materials in Electronics

ISSN:0957-4522|18|7|799-804

Springer Publishing Company ‎(2007)‎

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