By Beauchene T.   Tremouilles D.   Lewis D.   Perdu P.   Fouillat P.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1577-1582

Elsevier‎(2003)‎

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By Lewis D.   Fouillat P.   Pouget V.   Lapuyade H.   in EPJ Applied Physics (The)

ISSN:1286-0042|20|2|151-158

Edp Sciences‎(2002)‎

Access to resources Favorite 7.985835

By Darracq F.   Lapuyade H.   Buard N.   Fouillat P.   Dufayel R.   Carriere T.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1615-1619

Elsevier‎(2003)‎

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