By Uemori Satoshi   Ishii Masamichi   Kobayashi Haruo   Hirabayashi Daiki   Arakawa Yuta   Doi Yuta   Kobayashi Osamu   Matsuura Tatsuji   Niitsu Kiichi   Yano Yuji   Gake Tatsuhiro   Yamaguchi Takahiro   Takai Nobukazu   in Journal of Electronic Testing

ISSN:0923-8174|29|6|879-892

Springer Publishing Company ‎(2013)‎

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