By Lalinsky´ T   Haščík Sˇ.   Mozolová Ž.   Burian E   Krnáč M   Tomáška M   Škriniarová J   Drzˇík M   Kosticˇ I   Matay L   in Microelectronics International

ISSN:1356-5362|20|1|43-47

Emerald Group Publishing Ltd‎(2003)‎

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