By Wallenta Christian   Kim Jungwon   Bentley Peter   Hailes Stephen   in Applied Intelligence

ISSN:0924-669X|32|1|1-26

Springer Publishing Company ‎(2010)‎

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By Pugh David C   Hailes Stephen M V   Parkin Ivan P   in Measurement Science and Technology

ISSN:0957-0233|26|8|85102-85110

IOP Publishing‎(2015)‎

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