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By Osawa T. Ishida2 K. Onodera1 M. Feng1 X-Y. Hayashi2 S. Nozaka1 Y. in Journal of Electron Microscopy
ISSN:0022-0744|51|3|195-197
Oxford University Press(2002)
Access to resources Favorite 1.4625254
By Osawa T. Ishida2 K. Onodera1 M. Feng1 X-Y. Hayashi2 S. Nozaka1 Y. in Journal of Electron Microscopy
ISSN:0022-0744|51|5|341-345
Oxford University Press(2002)
Access to resources Favorite 1.4625254