By Muraki Yuko   Yamada Masao   Yoshida Mariko   Yamada Shunji   Padilla Jorge   Hatano Yoshihiro   Hiramatsu Yoshio   Uno Fumio   Nii Shiro   in Journal of Electron Microscopy

ISSN:0022-0744|45|3|223-231

Oxford University Press‎(1996)‎

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