By Roy D   Chakroborty R   Kaushik B K   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|55|10|553-557

The British Institute of Non-Destructive Testing‎(2013)‎

Access to resources Favorite 10.641877

By Verma K.G.   Kaushik B.K.   Singh R.   in Microelectronics International

ISSN:1356-5362|26|3|49-55

Emerald Group Publishing Ltd‎(2009)‎

Access to resources Favorite 2.2740467

By Sharma D.K.   Sharma R.K.   Kaushik B.K.   Kumar Pankaj   in Circuit World

ISSN:0305-6120|37|3|27-34

Emerald Group Publishing Ltd‎(2011)‎

Access to resources Favorite 1.8192374

By Quamara J.K.   Kaushik B.K.   Mahna S.K.   Asokan K.   in Vacuum

ISSN:0042-207X|48|12|995-997

Elsevier‎(1997)‎

Access to resources Favorite 1.8192374

By Kaushik B.K.   Sarkar S.   Agarwal R.P.   Joshi R.C.   in Microelectronics International

ISSN:1356-5362|24|1|40-45

Emerald Group Publishing Ltd‎(2007)‎

Access to resources Favorite 1.8192374

By VermaS.K.Department of Computer Science and Engineering   G.B. Pant Engineering College   Pauri-Garhwal   India   KaushikB.K.Department of Electronics and Communication Engineering   Indian Institute of Technology   Roorkee   India   in Journal of Engineering, Design and Technology

ISSN:1726-0531|13|3|486-498

Emerald Group Publishing Ltd‎(2015)‎

Access to resources Favorite 1.364428