By Kisielowski C.   Schwander P.   Baumann F.H.   Seibt M.   Kim Y.   Ourmazd A.   in Ultramicroscopy

ISSN:0304-3991|58|2|131-155

Elsevier‎(1995)‎

Access to resources Favorite 6.4625072

By Ayache J.   Kisielowski C.   Kilaas R.   Passerieux G.   Lartigue-Korinek S.   in Journal of Materials Science

ISSN:0022-2461|40|12|3091-3100

Springer Publishing Company ‎(2005)‎

Access to resources Favorite 6.4625072

By Kisielowski C.   Hetherington C.J.D.   Wang Y.C.   Kilaas R.   O'Keefe M.A.   Thust A.   in Ultramicroscopy

ISSN:0304-3991|89|4|243-263

Elsevier‎(2001)‎

Access to resources Favorite 6.021186

By Sudhir G.   Fujii H.   Wong W.   Kisielowski C.   Newman N.   Dieker C.   Liliental-Weber Z.   Rubin M.   Weber E.   in Journal of Electronic Materials

ISSN:1543-186X|27|4|215-221

Springer Publishing Company ‎(1998)‎

Access to resources Favorite 5.158207

By O'Keefe M.A.   Hetherington C.J.D.   Wang Y.C.   Nelson E.C.   Turner J.H.   Kisielowski C.   Malm J.-O.   Mueller R.   Ringnalda J.   Pan M.   Thust A.   in Ultramicroscopy

ISSN:0304-3991|89|4|215-241

Elsevier‎(2001)‎

Access to resources Favorite 4.73655