By Jakovenko J.   Husak M.   Lalinsky T.   in Microelectronics Reliability

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Elsevier‎(2004)‎

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By Hasck S.   Mozolova Z.   Lalinsky T.   Tomaska M.   Kostic I.   in Vacuum

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Elsevier‎(2002)‎

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By Hasscik S.   Kuzmik J.   Porges M.   Mozolova Z.   Lalinsky T.   in Vacuum

ISSN:0042-207X|47|10|1215-1217

Elsevier‎(1996)‎

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By Hascik S.   Lalinsky T.   Mozolova Z.   Kuzmik J.   in Vacuum

ISSN:0042-207X|51|2|307-309

Elsevier‎(1998)‎

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By Hotovy I.   Rehacek V.   Mika F.   Lalinsky T.   Hascik S.   Vanko G.   Drzik M.   in Microsystem Technologies

ISSN:0946-7076|14|4-5|629-635

Springer Publishing Company ‎(2008)‎

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By Lalinsky T.   Skriniarova J.   Kuzmk J.   Hasenohrl S.   Fox A.   Tomaska M.   Mozolova Z.   Kovacik T.   Krajcer A.   Kordos P.   in Vacuum

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Elsevier‎(2001)‎

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By Lalinsky T.   Skriniarova J.   Kostic I.   Hart van der A.   Hrkut P.   Hasck S.   Matay L.   Mozolova Z.   Kordos P.   in Vacuum

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Elsevier‎(2001)‎

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By Kuzmk J.   Hasenohrl S.   Kudela R.   Hasck S.   Mozolova Z.   Lalinsky T.   Vogrincic P.   Breza J.   Skriniarova J.   Fox A.   Kordos P.   in Vacuum

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Elsevier‎(2001)‎

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By Lalinsky´ T   Haščík Sˇ.   Mozolová Ž.   Burian E   Krnáč M   Tomáška M   Škriniarová J   Drzˇík M   Kosticˇ I   Matay L   in Microelectronics International

ISSN:1356-5362|20|1|43-47

Emerald Group Publishing Ltd‎(2003)‎

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