By Dussaigne A   Corfdir P   Levrat J   Zhu T   Martin D   Lefebvre P   Ganière J-D   Butté R   Deveaud-Plédran B   Grandjean N   Arroyo Y   Stadelmann P   in Semiconductor Science and Technology

ISSN:0268-1242|26|2|25012-25020

IOP Publishing‎(2011)‎

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