By Whittington C M   Yeung K L K   Lo W Y   in Transactions of the Institute of Metal Finishing

ISSN:0020-2967|89|3|122-131

Maney Publishing‎(2011)‎

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By Lo W.-Y.   Ker M.-D.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1583-1588

Elsevier‎(2003)‎

Access to resources Favorite 2.6896176