By Kosyachenko L A   Lambropoulos C P   Aoki T   Dieguez E   Fiederle M   Loukas D   Sklyarchuk O V   Maslyanchuk O L   Grushko E V   Sklyarchuk V M   Crocco J   Bensalah H   in Semiconductor Science and Technology

ISSN:0268-1242|27|1|15007-15017

IOP Publishing‎(2012)‎

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