By Meneghesso G.   Novembre N.   Zanoni E.   Sponton L.   Cerati L.   Croce G.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1589-1594

Elsevier‎(2003)‎

Access to resources Favorite 6.465044

By Meneghesso G.   Levada S.   Zanoni E.   Scamarcio G.   Mura G.   Podda S.   Vanzi M.   Du S.   Eliashevich I.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1737-1742

Elsevier‎(2003)‎

Access to resources Favorite 5.60194

By Salviati G.   Rossi F.   Armani N.   Pavesi M.   Manfredi M.   Meneghesso G.   Zanoni E.   Castaldini A.   Cavallini A.   in EPJ Applied Physics (The)

ISSN:1286-0042|27|1-3|345-348

Edp Sciences‎(2010)‎

Access to resources Favorite 5.60194