By Isa F   Pezzoli F   Isella G   Meduňa M   Falub C V   Müller E   Kreiliger T   Taboada A G   von Känel H   Miglio Leo   in Semiconductor Science and Technology

ISSN:0268-1242|30|10|105001-105009

IOP Publishing‎(2015)‎

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