By Mosleh Aboozar   Ghetmiri Seyed   Conley Benjamin   Hawkridge Michael   Benamara Mourad   Nazzal Amjad   Tolle John   Yu Shui-Qing   Naseem Hameed   in Journal of Electronic Materials

ISSN:1543-186X|43|4|938-946

Springer Publishing Company ‎(2014)‎

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