By Das Tejasvi   Gopalan Anand   Washburn Clyde   Mukund P.   in Journal of Electronic Testing

ISSN:0923-8174|22|4-6|371-386

Springer Publishing Company ‎(2006)‎

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By Oztan Basak   Sharma Gaurav   Pasupuleti Ajay   Mukund P. R.   in Archiving Conference

ISSN:2161-8798|2009|1|197-202

Society for Imaging Science and Technology‎(2009)‎

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