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ISSN:0268-1242|31|2|25008-25016

IOP Publishing‎(2016)‎

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By Lucarelli N.   Cavone M.   Muschitiello M.   Centrone D.   Corsi F.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1699-1704

Elsevier‎(2003)‎

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