By Ren X   Huang H   Dubrovskii V G   Sibirev N V   Nazarenko M V   Bolshakov A D   Ye X   Wang Q   Huang Y   Zhang X   Guo J   Liu X   in Semiconductor Science and Technology

ISSN:0268-1242|26|1|14034-14041

IOP Publishing‎(2011)‎

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